• DocumentCode
    622474
  • Title

    A systematic method to guide the choice of ridge parameter in ridge extreme learning machine

  • Author

    Meng Joo Er ; Zhifei Shao ; Ning Wang

  • Author_Institution
    Marine Eng. Coll., Dalian Maritime Univ., Dalian, China
  • fYear
    2013
  • fDate
    12-14 June 2013
  • Firstpage
    852
  • Lastpage
    857
  • Abstract
    Extreme Learning Machine (ELM) has attracted many researchers as a universal function approximator because of its extremely fast learning speed and good generalization performance. Recently, a new trend in ELM emerges to combine it with ridge regression, which has been shown improved stability and generalization performance. However, this ridge parameter is determined through a trial-and-error manner, an unsatisfactory approach for automatic learning applications. In this paper, the differences between ridge ELM and ordinary Neural Networks are discussed as well as special properties of ridge ELM and various approaches to derive the ridge parameter. Furthermore, a semi-cross-validation ridge parameter selection procedure based on the special properties of ridge ELM is proposed. This approach, termed as Semi-Cross-validation Ridge ELM (SC-R-ELM), is also demonstrated to achieve robust and reliable results in 11 regression data sets.
  • Keywords
    function approximation; learning (artificial intelligence); neural nets; regression analysis; SC-R-ELM; automatic learning applications; generalization performance; learning speed; ordinary neural networks; regression data sets; ridge ELM; ridge extreme learning machine; ridge parameter; ridge regression; semicross-validation ridge parameter selection procedure; systematic method; trial-and-error manner; universal function approximator; Biological neural networks; Educational institutions; Equations; Mathematical model; Neurons; Testing; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Control and Automation (ICCA), 2013 10th IEEE International Conference on
  • Conference_Location
    Hangzhou
  • ISSN
    1948-3449
  • Print_ISBN
    978-1-4673-4707-5
  • Type

    conf

  • DOI
    10.1109/ICCA.2013.6564900
  • Filename
    6564900