DocumentCode :
622536
Title :
EKF-based estimation of SOC and temperature in ultracapacitors
Author :
Chia-Jui Chiang ; Jing-Long Yang ; Wen-Chin Cheng
Author_Institution :
Dept. of Mech. Eng., Nat. Taiwan Univ. of Sci. & Technol., Taipei, Taiwan
fYear :
2013
fDate :
12-14 June 2013
Firstpage :
274
Lastpage :
279
Abstract :
In this paper, simultaneous estimation of state-of-charge (SOC) and temperature is achieved by applying extended Kalman filter (EKF) algorithm with only the terminal measurement of voltage and current. For the application of EKF algorithm, a nonlinear model which consists of a voltageand-thermal-dependent equivalent circuit model and a thermal model is used. The parameters in the equivalent circuit model are identified by applying least squares method to the electrochemical impedance spectroscopy (EIS) data. Experimental results demonstrate that the EKF-based estimator achieves improved and consistent prediction of SOC and temperature in existence of modeling errors and measurement noises, especially at low temperature. The accurate estimation of SOC and temperature enables optimum energy and thermal management of the ultracapacitors.
Keywords :
Kalman filters; electrochemical impedance spectroscopy; equivalent circuits; least squares approximations; nonlinear filters; supercapacitors; thermal management (packaging); EIS data; EKF algorithm; EKF-based estimation; EKF-based estimator; SOC; current; electrochemical impedance spectroscopy data; extended Kalman filter algorithm; least squares method; measurement noises; modeling errors; nonlinear model; simultaneous estimation; state-of-charge; temperature; terminal measurement; thermal management; thermal model; thermal-dependent equivalent circuit model; ultracapacitors; voltage-dependent equivalent circuit model; Discharges (electric); Estimation; Integrated circuit modeling; Supercapacitors; System-on-chip; Temperature measurement; Voltage measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Control and Automation (ICCA), 2013 10th IEEE International Conference on
Conference_Location :
Hangzhou
ISSN :
1948-3449
Print_ISBN :
978-1-4673-4707-5
Type :
conf
DOI :
10.1109/ICCA.2013.6564963
Filename :
6564963
Link To Document :
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