• DocumentCode
    622851
  • Title

    A multi-solver domain decomposition method for rigorous conductor modeling of signal integrity in integrated circuits

  • Author

    Yang Shao ; Zhen Peng ; Jin-Fa Lee

  • Author_Institution
    ElectroScience Lab., Ohio State Univ. Univ., Columbus, OH, USA
  • fYear
    2013
  • fDate
    20-24 May 2013
  • Firstpage
    328
  • Lastpage
    329
  • Abstract
    A frequency-domain multi-solver domain decomposition method is presented to accurately analyze signal integrity problems in multi-scale integrated circuits. In particular, we propose a novel formulation to rigorously account for the conductor loss due to finite conductivities in metals. The proposed non-conformal domain decomposition method follows a hierarchical domain partitioning strategy of the original problem. The most suitable computational electromagnetic technique is employed for each of the subregions. To improve the convergence in the DDM iterations, an optimized Robin type transmission condition is introduced to enforce the field continuities across sub-domain interfaces. Moreover, a hierarchical multi-level fast multiple method is adopted to address the low frequency issues particularly in IC applications. Rigorous numerical experiments validate the potential efficiency and benefits offered by the proposed method.
  • Keywords
    computational electromagnetics; frequency-domain analysis; integrated circuit modelling; iterative methods; conductor loss; frequency domain multisolver domain decomposition method; hierarchical domain partitioning; hierarchical multilevel fast multiple method; integrated circuits; nonconformal domain decomposition method; optimized Robin type transmission condition; rigorous conductor modeling; signal integrity; Computational modeling; Conductors; Dielectrics; Integrated circuit modeling; Material properties; Mathematical model;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Theory (EMTS), Proceedings of 2013 URSI International Symposium on
  • Conference_Location
    Hiroshima
  • Print_ISBN
    978-1-4673-4939-0
  • Type

    conf

  • Filename
    6565743