Title :
Technology of splitting PCB conductors to weaken the parasitic parameters for planar EMI filter
Author :
Wang Shishan ; Gong min ; Chen Chen ; Wang Wentao
Author_Institution :
Coll. of Autom. Eng., Nanjing Univ. of Aeronaut. & Astronaut., Nanjing, China
Abstract :
EMI filter has been more and more attention because of its suppression of the effectiveness of the conducted EMI in switching power supply. Compared to the filter of discrete components, planar EMI filter has the advantages of small size and high-frequency performance. However, the inductance of the equivalent parallel capacitance (EPC) and equivalent series resistance (ESR) of such filters has its special requirements. Based on the basic principles of the EMI filter, the affect of the PCB conductor cross-section design of the common mode inductor performance is analyzed in this paper; Under the conditions of the existing technology, a kind of planar integrated LC unit based on split parallel structure is proposed and the EPC and ESR of common-mode inductance of split parallel structure of LC unit is analyzed. Some corresponding experiments are done and the result is compared with single-stranded structure.
Keywords :
capacitance; conductors (electric); electric resistance; electromagnetic interference; filtering theory; power supplies to apparatus; printed circuits; EPC; ESR; PCB conductor cross-section design; common mode inductor performance; conducted EMI; discrete components; equivalent parallel capacitance; equivalent series resistance; high-frequency performance; parasitic parameters; planar EMI filter; planar integrated LC unit; single-stranded structure; split parallel structure; splitting PCB conductors; switching power supply; Capacitance; Conductors; Electromagnetic interference; Periodic structures; Power filters; Resistance; Wires; finite element method (FEM); planar EMI filter; skin effect;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2013 8th IEEE Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-6320-4
DOI :
10.1109/ICIEA.2013.6566412