Title :
A high-resolution technique for flicker measurement in power quality monitoring
Author :
Cheng-I Chen ; Yeong-Chin Chen ; Chao-Nan Chen
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Taoyuan, Taiwan
Abstract :
Flicker is one of significant power quality disturbances, which may lead to serious voltage fluctuation. Therefore, the accurate estimation of flicker components plays an important role in the power quality monitoring and protection of power system. In this paper, a high-resolution technique is proposed to extract the flicker components effectively. Different from the conventional spectral analysis methods, the performance of proposed mechanism would not be influenced by the fundamental frequency deviation, the sampling frequency, and the length of sampled data. With the experimental test, the estimation accuracy and robustness are verified.
Keywords :
frequency estimation; power supply quality; power system measurement; power system protection; spectral analysis; voltage measurement; flicker component estimation; flicker measurement accuracy; fundamental frequency deviation; high-resolution technique; power quality disturbance; power quality monitoring; power system protection; sampling frequency; spectral analysis; voltage fluctuation; Accuracy; Estimation; Frequency measurement; Mathematical model; Power quality; Signal resolution; Voltage fluctuations; flicker; flickermeter; fundamental frequency deviation; high-resolution technique; power quality;
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2013 8th IEEE Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-6320-4
DOI :
10.1109/ICIEA.2013.6566426
