A high-resolution technique for flicker measurement in power quality monitoring

Author

Cheng-I Chen ; Yeong-Chin Chen ; Chao-Nan Chen

Author_Institution

Dept. of Electr. Eng., Nat. Central Univ., Taoyuan, Taiwan

fYear

2013

fDate

19-21 June 2013

Firstpage

528

Lastpage

533

Abstract

Flicker is one of significant power quality disturbances, which may lead to serious voltage fluctuation. Therefore, the accurate estimation of flicker components plays an important role in the power quality monitoring and protection of power system. In this paper, a high-resolution technique is proposed to extract the flicker components effectively. Different from the conventional spectral analysis methods, the performance of proposed mechanism would not be influenced by the fundamental frequency deviation, the sampling frequency, and the length of sampled data. With the experimental test, the estimation accuracy and robustness are verified.

Keywords

frequency estimation; power supply quality; power system measurement; power system protection; spectral analysis; voltage measurement; flicker component estimation; flicker measurement accuracy; fundamental frequency deviation; high-resolution technique; power quality disturbance; power quality monitoring; power system protection; sampling frequency; spectral analysis; voltage fluctuation; Accuracy; Estimation; Frequency measurement; Mathematical model; Power quality; Signal resolution; Voltage fluctuations; flicker; flickermeter; fundamental frequency deviation; high-resolution technique; power quality;

fLanguage

English

Publisher

ieee

Conference_Titel

Industrial Electronics and Applications (ICIEA), 2013 8th IEEE Conference on

Conference_Location

Melbourne, VIC

Print_ISBN

978-1-4673-6320-4

Type

conf

DOI

10.1109/ICIEA.2013.6566426

Filename

6566426