DocumentCode
623238
Title
A novel approach for outlier detection and clustering improvement
Author
Ahmed, Mariwan ; Naser, Aws
Author_Institution
Sch. of Eng. & Inf. Technol., Univ. of New South Wales, Canberra, ACT, Australia
fYear
2013
fDate
19-21 June 2013
Firstpage
577
Lastpage
582
Abstract
Outlier detection is used to detect abnormalities in various application domains including clustering based disease onset identification, gene expression analysis, computer network intrusion, financial fraud detection and human behaviour analysis. Existing methods to detect outliers are inadequate due to poor accuracy and lack of any general technique. Most techniques consider either small clusters as outliers or provide a score for being outlier to each data object. These approaches have limitations due to high computational complexity and misidentification of normal data object as outliers. In this paper, we provide a novel unsupervised approach to detect outliers using a modified k-means clustering algorithm. The detected outliers are removed from the dataset to improve clustering accuracy. We validate our approach by comparing against existing techniques and benchmark performance. Experimental results on benchmark datasets show that our proposed technique outperforms existing methods on several measures.
Keywords
computational complexity; data analysis; pattern clustering; abnormality detection; computational complexity; data analysis; modified k-means clustering algorithm; normal data object misidentification; outlier detection; unsupervised approach; Accuracy; Benchmark testing; Clustering algorithms; Computers; Credit cards; Educational institutions; Machine learning algorithms; Clustering; Outlier detection;
fLanguage
English
Publisher
ieee
Conference_Titel
Industrial Electronics and Applications (ICIEA), 2013 8th IEEE Conference on
Conference_Location
Melbourne, VIC
Print_ISBN
978-1-4673-6320-4
Type
conf
DOI
10.1109/ICIEA.2013.6566435
Filename
6566435
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