DocumentCode :
623471
Title :
Research on testability modeling with Bayesian network based on multi-signal flow model
Author :
Chunling Yang ; Siwen Zhang ; Chenmin Tong ; Dazhong Gu
Author_Institution :
Sch. of Electr. Eng. & Autom., Harbin Inst. of Technol., Harbin, China
fYear :
2013
fDate :
19-21 June 2013
Firstpage :
1870
Lastpage :
1873
Abstract :
As the method of testability modeling and analysis, multi-signal flow model is now widely used. It can describe the certain dependency matrix between faults and tests, but it doesn´t have the ability to describe the uncertain relation between faults and tests. In reality, the uncertain factors can be found everywhere in the process of testing, so the uncertainty of testing is taken into consideration in this paper. The fault detection rate and fault isolation rate can be calculated on the basis of the uncertain dependency matrix. The method proposed in this paper is verified by building the model of filter circuit.
Keywords :
belief networks; circuit reliability; circuit testing; fault diagnosis; filters; matrix algebra; network analysis; Bayesian network; dependency matrix; fault detection rate; fault isolation rate; filter circuit testing; multisignal flow model; testability modeling research; uncertain factors; uncertain relation; Analytical models; Bayes methods; Circuit faults; Fault detection; Finite impulse response filters; Integrated circuit modeling; Mathematical model; Bayesian network; multi-signal flow model; testability modeling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Electronics and Applications (ICIEA), 2013 8th IEEE Conference on
Conference_Location :
Melbourne, VIC
Print_ISBN :
978-1-4673-6320-4
Type :
conf
DOI :
10.1109/ICIEA.2013.6566672
Filename :
6566672
Link To Document :
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