DocumentCode
624156
Title
CFRSL rain measurement facility — Part-2 rain profiling radar
Author
Schneider, Larry ; Junek, William ; Jones, Lewis ; Troshin, Maxim
Author_Institution
Dept. of EECS, Univ. of Central Florida, Orlando, FL, USA
fYear
2013
fDate
4-7 April 2013
Firstpage
1
Lastpage
6
Abstract
The Central Florida Remote Sensing Laboratory has established a rain measurement facility in Central, Fl to study the statistical properties of tropical rainfall and the associated interaction with electromagnetic waves. The rain absorption coefficient is an important parameter, which governs the atmospheric propagation absorption loss during rainfall. This paper (part-2 of 2) describes this research facility and presents the theoretical design of a rain profiling radar system. This L-band pulsed radar will provide zenith-viewing reflectivity measurements over altitude increments of 150 m to augment a passive microwave radiometer that is used to estimate the rain absorption coefficient at C-band. A theoretical “Z-R” relationship (radar reflectivity values associated with corresponding rain rate) is used in a MATLAB radar simulation to illustrate the radar measurement performance using a numerical weather model to provide a realistic thunderstorm rainfall event.
Keywords
atmospheric electromagnetic wave propagation; meteorological radar; rain; remote sensing by radar; weather forecasting; C-band; CFRSL rain measurement facility; Central Florida Remote Sensing Laboratory; L-band pulsed radar; MATLAB radar simulation; Z-R relationship; atmospheric propagation absorption loss; electromagnetic waves; numerical weather model; passive microwave radiometer; radar measurement; rain absorption coefficient; rain profiling radar system; realistic thunderstorm rainfall event; tropical rainfall statistical properties; zenith-viewing reflectivity measurements; Noise; Radar antennas; Radar measurements; Rain; Receivers; Sun; dBZ; rain radar reflectivity; zenith rain profile;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon, 2013 Proceedings of IEEE
Conference_Location
Jacksonville, FL
ISSN
1091-0050
Print_ISBN
978-1-4799-0052-7
Type
conf
DOI
10.1109/SECON.2013.6567373
Filename
6567373
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