DocumentCode
624163
Title
Feature ranking using Gini index, scatter ratios, and nonlinear SVM RFE
Author
Test, Erik ; Zigic, Ljiljana ; Kecman, Vojislav
Author_Institution
Virginia Commonwealth Univ., Richmond, VA, USA
fYear
2013
fDate
4-7 April 2013
Firstpage
1
Lastpage
5
Abstract
This paper introduces three feature ranking (FR) methods using seven classification benchmarks created by Exhaustive Search (ES) which selected the best feature subsets. Next, three different FR approaches are compared and ranked in respect to the top five best feature subsets for each data set obtained by ES. The results show that Gini index (GI) outperforms scatter ratios for multi-class problems on average. However, for binary classification, scatter ratios shows better performance. Nonlinear support vector machines for recursive feature elimination (NL SVM RFE) was run on three binary benchmarks and it leads to rankings closest to ES on average over GI and scatter ratio methods.
Keywords
feature extraction; pattern classification; recursive estimation; search problems; support vector machines; FR methods; Gini Index; binary benchmarks; binary classification; exhaustive search; feature ranking; nonlinear SVM RFE; nonlinear support vector machines; recursive feature elimination; scatter ratios; Accuracy; Benchmark testing; Glass; Indexes; Kernel; Machine learning algorithms; Support vector machines; Embedded System; Exhaustive Search; Feature Ranking; Filter; Nonlinear Support Vector Recursive Feature Elimination;
fLanguage
English
Publisher
ieee
Conference_Titel
Southeastcon, 2013 Proceedings of IEEE
Conference_Location
Jacksonville, FL
ISSN
1091-0050
Print_ISBN
978-1-4799-0052-7
Type
conf
DOI
10.1109/SECON.2013.6567380
Filename
6567380
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