• DocumentCode
    624163
  • Title

    Feature ranking using Gini index, scatter ratios, and nonlinear SVM RFE

  • Author

    Test, Erik ; Zigic, Ljiljana ; Kecman, Vojislav

  • Author_Institution
    Virginia Commonwealth Univ., Richmond, VA, USA
  • fYear
    2013
  • fDate
    4-7 April 2013
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    This paper introduces three feature ranking (FR) methods using seven classification benchmarks created by Exhaustive Search (ES) which selected the best feature subsets. Next, three different FR approaches are compared and ranked in respect to the top five best feature subsets for each data set obtained by ES. The results show that Gini index (GI) outperforms scatter ratios for multi-class problems on average. However, for binary classification, scatter ratios shows better performance. Nonlinear support vector machines for recursive feature elimination (NL SVM RFE) was run on three binary benchmarks and it leads to rankings closest to ES on average over GI and scatter ratio methods.
  • Keywords
    feature extraction; pattern classification; recursive estimation; search problems; support vector machines; FR methods; Gini Index; binary benchmarks; binary classification; exhaustive search; feature ranking; nonlinear SVM RFE; nonlinear support vector machines; recursive feature elimination; scatter ratios; Accuracy; Benchmark testing; Glass; Indexes; Kernel; Machine learning algorithms; Support vector machines; Embedded System; Exhaustive Search; Feature Ranking; Filter; Nonlinear Support Vector Recursive Feature Elimination;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Southeastcon, 2013 Proceedings of IEEE
  • Conference_Location
    Jacksonville, FL
  • ISSN
    1091-0050
  • Print_ISBN
    978-1-4799-0052-7
  • Type

    conf

  • DOI
    10.1109/SECON.2013.6567380
  • Filename
    6567380