Title :
Extracting device-parameter variations using a single sensitivity-configurable ring oscillator
Author :
Higuchi, Yuji ; Shinkai, Ken-ichi ; Hashimoto, Mime ; Rao, Ramesh ; Nassif, S.
Author_Institution :
Dept. Inf. Syst. Eng., Osaka Univ., Suita, Japan
Abstract :
The RO(Ring-Oscillator)-based sensor is one of easily-implementable variation sensors, but for decomposing the observed variability into multiple unique device-parameter variations, a large number of ROs with different structures and sensitivities to device-parameters is required. This paper proposes a scheme for sensing multiple device-parameter variations with just a single reconfigurable RO. This sensitivity-configurable RO has a number of configurations available and this property can be exploited for reducing sensor area while improving estimation accuracy through iterative estimation. To minimize the prospective error, the proposed estimation iterates: (1) selecting the best configuration that minimizes the prospective estimation error around the current estimates; and (2) updating the estimates with the selected configuration. This experiment was carried out assuming a 32-nm predictive technology model. Experimental results show that device-parameter extraction with a single RO is feasible and the error of the extracted parameters is reduced by 35 to 53% with the improved objective function and iterative estimation.
Keywords :
iterative methods; oscillators; parameter estimation; sensors; RO based sensor; easily-implementable variation sensors; estimation error; iterative estimation; multiple unique device-parameter variation extaction; objective function; predictive technology model; single sensitivity reconfigurable ring oscillator; size 32 nm; Accuracy; Equations; Estimation error; Frequency measurement; Linear programming; Sensitivity;
Conference_Titel :
Test Symposium (ETS), 2013 18th IEEE European
Conference_Location :
Avignon
Print_ISBN :
978-1-4673-6376-1
DOI :
10.1109/ETS.2013.6569366