• DocumentCode
    625264
  • Title

    Reconciling the IC test and security dichotomy

  • Author

    Sinanoglu, Ozgur ; Karimi, N. ; Rajendran, Jeyavijayan ; Karri, Ramesh ; Jin, Yichao ; Huang, Kejie ; Makris, Yiorgos

  • Author_Institution
    NYU, Abu Dhabi, United Arab Emirates
  • fYear
    2013
  • fDate
    27-30 May 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Many of the design companies cannot afford owning and acquiring expensive foundries and hence, go fabless and outsource their design fabrication to foundries that are potentially untrustwrothy. This globalization of Integrated Circuit (IC) design flow has introduced security vulnerabilities. If a design is fabricated in a foundry that is outside the direct control of the (fabless) design house, reverse engineering, malicious circuit modification, and Intellectual Property (IP) piracy are possible. In this tutorial, we elaborate on these and similar hardware security threats by making connections to VLSI testing. We cover design-for-trust techniques, such as logic encryption, aging acceleration attacks, and statistical methods that help identify Trojan´ed and counterfeit ICs.
  • Keywords
    VLSI; ageing; industrial property; integrated circuit design; integrated circuit testing; logic circuits; logic design; reverse engineering; security; statistical analysis; IC design; IC testing; IP; Trojan´ed identification; VLSI testing; aging acceleration attack; design-for-trust technique; hardware security threat; integrated circuit design flow; integrated circuit fabrication; intellectual property piracy; logic encryption; malicious circuit modification; reverse engineering; security dichotomy vulnerability; statistical method; Aging; Encryption; Foundries; Hardware; Integrated circuits; Logic gates; Semiconductor device measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2013 18th IEEE European
  • Conference_Location
    Avignon
  • Print_ISBN
    978-1-4673-6376-1
  • Type

    conf

  • DOI
    10.1109/ETS.2013.6569368
  • Filename
    6569368