DocumentCode :
625272
Title :
Optimization for timing-speculated circuits by redundancy addition and removal
Author :
Yuxi Liu ; Rong Ye ; Feng Yuan ; Qiang Xu
Author_Institution :
Dept. of Comput. Sci. & Eng., Chinese Univ. of Hong Kong, Hong Kong, China
fYear :
2013
fDate :
27-30 May 2013
Firstpage :
1
Lastpage :
6
Abstract :
Integrated circuits suffer from severe variation effects with technology scaling, making their timing behavior increasingly unpredictable. Timing speculation is a promising technique to tackle this problem with the help of online timing error detection and correction mechanisms. In this paper, we propose to use redundancy addition and removal (RAR) technique to optimize timing-speculated circuits. By intentionally removing wires on those frequently-exercised critical paths and replacing them with wires on less critical ones (if possible), the proposed technique is able to greatly reduce the timing error rate of the circuit and improve its overall throughput, as shown in our experimental results on various benchmark circuits.
Keywords :
integrated circuit reliability; RAR technique; correction mechanisms; critical paths; integrated circuits; online timing error detection; redundancy addition and removal technique; technology scaling; timing-speculated circuits; Delays; Error probability; Logic gates; Optimization; Throughput; Wires;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Symposium (ETS), 2013 18th IEEE European
Conference_Location :
Avignon
Print_ISBN :
978-1-4673-6376-1
Type :
conf
DOI :
10.1109/ETS.2013.6569376
Filename :
6569376
Link To Document :
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