DocumentCode
625273
Title
An error-detection and self-repairing method for dynamically and partially reconfigurable systems
Author
Reorda, M. Sonza ; Sterpone, L. ; Ullah, Abrar
Author_Institution
Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
fYear
2013
fDate
27-30 May 2013
Firstpage
1
Lastpage
7
Abstract
Reconfigurable systems are gaining an increasing interest in the domain of safety-critical applications, for example in space and avionic applications. In fact, the capability of reconfiguring the system during run-time execution and the high computational power of modern Field Programmable Gate Arrays (FPGAs) makes these devices suitable for data processing. Moreover, such systems must also guarantee the abilities of self-awareness, self-diagnosis and self-repair in order to cope with errors due to the harsh conditions typically existing in some environments. In this paper we propose a self-repairing method for partially and dynamically reconfigurable systems applied at a fine-grain granularity level. Our method is able to recover and correct errors using the run-time partial reconfiguration capabilities offered by modern SRAM-based FPGAs. Fault injection experiments have been executed on a dynamically reconfigurable system embedding a number of benchmark circuits. Results demonstrate that the method can achieve full detection of single and multiple errors, while significantly improving the system availability with respect to traditional error detection and correction methods.
Keywords
SRAM chips; error correction; error detection; field programmable gate arrays; SRAM-based FPGA; avionic application; benchmark circuit; data processing; dynamicall-reconfigurable system; dynamically-reconfigurable system; error correction method; error recovery; fault injection experiment; field programmable gate arrays; fine-grain granularity level; multiple-error detection method; partially-reconfigurable system; run-time execution; run-time partial reconfiguration capability; self-awareness ability; self-diagnosis ability; self-repairing method; single-error detection method; space application; system availability; system reconfiguration capability; Circuit faults; Clocks; Field programmable gate arrays; Logic gates; Redundancy; Routing; Table lookup; Multiple Bit Upsets (MBUs); Partial and Dynamic Reconfiguration; Self-Repair; Single Event Upsets (SEUs);
fLanguage
English
Publisher
ieee
Conference_Titel
Test Symposium (ETS), 2013 18th IEEE European
Conference_Location
Avignon
Print_ISBN
978-1-4673-6376-1
Type
conf
DOI
10.1109/ETS.2013.6569377
Filename
6569377
Link To Document