• DocumentCode
    625273
  • Title

    An error-detection and self-repairing method for dynamically and partially reconfigurable systems

  • Author

    Reorda, M. Sonza ; Sterpone, L. ; Ullah, Abrar

  • Author_Institution
    Dipt. di Autom. e Inf., Politec. di Torino, Turin, Italy
  • fYear
    2013
  • fDate
    27-30 May 2013
  • Firstpage
    1
  • Lastpage
    7
  • Abstract
    Reconfigurable systems are gaining an increasing interest in the domain of safety-critical applications, for example in space and avionic applications. In fact, the capability of reconfiguring the system during run-time execution and the high computational power of modern Field Programmable Gate Arrays (FPGAs) makes these devices suitable for data processing. Moreover, such systems must also guarantee the abilities of self-awareness, self-diagnosis and self-repair in order to cope with errors due to the harsh conditions typically existing in some environments. In this paper we propose a self-repairing method for partially and dynamically reconfigurable systems applied at a fine-grain granularity level. Our method is able to recover and correct errors using the run-time partial reconfiguration capabilities offered by modern SRAM-based FPGAs. Fault injection experiments have been executed on a dynamically reconfigurable system embedding a number of benchmark circuits. Results demonstrate that the method can achieve full detection of single and multiple errors, while significantly improving the system availability with respect to traditional error detection and correction methods.
  • Keywords
    SRAM chips; error correction; error detection; field programmable gate arrays; SRAM-based FPGA; avionic application; benchmark circuit; data processing; dynamicall-reconfigurable system; dynamically-reconfigurable system; error correction method; error recovery; fault injection experiment; field programmable gate arrays; fine-grain granularity level; multiple-error detection method; partially-reconfigurable system; run-time execution; run-time partial reconfiguration capability; self-awareness ability; self-diagnosis ability; self-repairing method; single-error detection method; space application; system availability; system reconfiguration capability; Circuit faults; Clocks; Field programmable gate arrays; Logic gates; Redundancy; Routing; Table lookup; Multiple Bit Upsets (MBUs); Partial and Dynamic Reconfiguration; Self-Repair; Single Event Upsets (SEUs);
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2013 18th IEEE European
  • Conference_Location
    Avignon
  • Print_ISBN
    978-1-4673-6376-1
  • Type

    conf

  • DOI
    10.1109/ETS.2013.6569377
  • Filename
    6569377