Variability-aware and fault-tolerant self-adaptive applications for many-core chips

The coming era of chips consisting of billions of gates foreshadows processors containing thousands of unreliable cores. In this context, high energy efficiency will be available, under the constraint that applications leverage the large amount of computing cores, while masking frequent faults of the chip. In this paper, an high-level method is proposed to map and manage a parallel application on an unreliable many-cores processor System on Chip subject to intra-die variability.