• DocumentCode
    625279
  • Title

    PinPoint: An algorithm for enhancing diagnostic resolution using capture cycle power information

  • Author

    Potluri, Sreeram ; Trinadh, Satya ; Baskaran, R. ; Chandrachoodan, Nitin ; Kamakoti, V.

  • Author_Institution
    Indian Inst. of Technol. Madras, Chennai, India
  • fYear
    2013
  • fDate
    27-30 May 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Conventional ATPG tools help in detecting only the equivalence class to which a fault belongs and not the fault itself. This paper presents PinPoint, a technique that further divides the equivalence class into smaller sets based on the capture power consumed by the circuit under test in the presence of different faults in it, thus aiding in narrowing down on the fault. Applying the technique on ITC benchmark circuits yielded significant improvement in diagnostic resolution.
  • Keywords
    automatic test pattern generation; circuit testing; digital circuits; fault diagnosis; ATPG tools; ITC benchmark circuits; PinPoint; capture cycle power information; circuit under test; diagnostic resolution; equivalence class; power consumption; Circuit faults; Clocks; Europe; Noise; Noise measurement; Testing; Transient analysis; Diagnostic Resolution; Power-Assisted Diagnosis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2013 18th IEEE European
  • Conference_Location
    Avignon
  • Print_ISBN
    978-1-4673-6376-1
  • Type

    conf

  • DOI
    10.1109/ETS.2013.6569384
  • Filename
    6569384