• DocumentCode
    625282
  • Title

    RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology

  • Author

    Kelma, C. ; Darfeuille, S. ; Neuburger, Andreas ; Lobnig, Andreas

  • Author_Institution
    NXP Semicond., Colombelles, France
  • fYear
    2013
  • fDate
    27-30 May 2013
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    This paper focuses on the RF BIST architecture of the receive path of an RF transceiver processed in the NXP in house CMOS technology with 0.14μm gate length.
  • Keywords
    CMOS integrated circuits; built-in self test; integrated circuit testing; radio transceivers; CMOS technology; NXP; RF BIST architecture; RF transceiver; receive part; receive path; size 0.14 mum; Attenuators; Built-in self-test; Gain measurement; Phase locked loops; Radio frequency; Receivers; Transceivers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2013 18th IEEE European
  • Conference_Location
    Avignon
  • Print_ISBN
    978-1-4673-6376-1
  • Type

    conf

  • DOI
    10.1109/ETS.2013.6569387
  • Filename
    6569387
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=625282