Title :
RF BIST and test strategy for the receive part of an RF transceiver in CMOS technology
Author :
Kelma, C. ; Darfeuille, S. ; Neuburger, Andreas ; Lobnig, Andreas
Author_Institution :
NXP Semicond., Colombelles, France
Abstract :
This paper focuses on the RF BIST architecture of the receive path of an RF transceiver processed in the NXP in house CMOS technology with 0.14μm gate length.
Keywords :
CMOS integrated circuits; built-in self test; integrated circuit testing; radio transceivers; CMOS technology; NXP; RF BIST architecture; RF transceiver; receive part; receive path; size 0.14 mum; Attenuators; Built-in self-test; Gain measurement; Phase locked loops; Radio frequency; Receivers; Transceivers;
Conference_Titel :
Test Symposium (ETS), 2013 18th IEEE European
Conference_Location :
Avignon
Print_ISBN :
978-1-4673-6376-1
DOI :
10.1109/ETS.2013.6569387
