Title :
A digitally-calibrated 20-Gb/s 60-GHz direct-conversion transceiver in 65-nm CMOS
Author :
Kawai, Shigeaki ; Minami, Ryutaro ; Tsukui, Y. ; Takeuchi, Yoshio ; Asada, Hideaki ; Musa, Afiqah ; Murakami, Ryo ; Sato, Takao ; Qinghong Bu ; Ning Li ; Miyahara, Masaya ; Okada, Kenichi ; Matsuzawa, Akira
Author_Institution :
Dept. Phys. Electron., Tokyo Inst. of Technol., Tokyo, Japan
Abstract :
This paper presents a digitally-calibrated 60-GHz direct-conversion transceiver. To improve the error vector magnitude (EVM) performance over the wide bandwidth, a digital calibration technique is applied. The 60-GHz transceiver implemented by 65 nm CMOS achieves the maximum data rates of 20 Gb/s in 16QAM mode. The transmitter and receiver consume 351 mW and 238 mW from 1.2 V supply, respectively. As a 60-GHz transceiver, the best Tx-to-Rx EVM performance of -26.2 dB is achieved for 16QAM 7Gb/s data rate.
Keywords :
CMOS integrated circuits; calibration; millimetre wave receivers; quadrature amplitude modulation; transceivers; CMOS; bit rate 20 Gbit/s; bit rate 7 Gbit/s; digital calibration technique; digitally-calibrated direct-conversion transceiver; error vector magnitude performance; frequency 60 GHz; power 238 mW; power 351 mW; receiver; size 65 nm; transmitter; voltage 1.2 V; Baseband; CMOS integrated circuits; Calibration; Gain; Mixers; Phase locked loops; Transceivers; 60GHz; CMOS; IQ-mismatch; calibration; direct-conversion transceiver; millimeter-wave;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2013 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6059-3
DOI :
10.1109/RFIC.2013.6569543
