DocumentCode :
625471
Title :
Power handling capability of an SOI RF switch
Author :
Joseph, Alvin ; Botula, A. ; Slinkman, J. ; Wolf, Robert ; Phelps, Rick ; Abou-Khalil, Michel ; Ellis-Monaghan, John ; Moss, Steven ; Jaffe, Matt
fYear :
2013
fDate :
2-4 June 2013
Firstpage :
385
Lastpage :
388
Abstract :
In this study, we define and investigate the maximum power handling capability (Pmax) in an SOI RF shunt branch switch. One of the critical factor in the Pmax is the non-uniform voltage division across an OFF shunt branch. In this study we provide a simple analytical method to determine the stack voltage imbalance. The Pmax is characterized as a function of various parameters, such as, switch stack height, channel length, Gate and Body bias, and process parameters. Overall, we find that the Pmax can be improved by reducing stack imbalance as well as device leakage currents, namely, GIDL.
Keywords :
microwave switches; silicon-on-insulator; GIDL; OFF shunt branch; SOI RF shunt branch switch; body bias; channel length; gate bias; maximum power handling capability; nonuniform voltage division; stack voltage imbalance; switch stack height; Couplings; Field effect transistors; Harmonic analysis; Leakage currents; Logic gates; Radio frequency; Switches; RF switch; SOI; front-end-module;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2013 IEEE
Conference_Location :
Seattle, WA
ISSN :
1529-2517
Print_ISBN :
978-1-4673-6059-3
Type :
conf
DOI :
10.1109/RFIC.2013.6569611
Filename :
6569611
Link To Document :
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