Title :
Nano switching crossbar array ESD protection structures
Author :
Wang, Xiongfei ; Shi, Zhiyan ; Liu, Jiangchuan ; Wang, Lingfeng ; Ma, Ronghua ; Zhao, Hang ; Dong, Zhaoyang ; Zhang, Chenghui ; Wang, Aiping
Author_Institution :
Univ. of California, Riverside, Riverside, CA, USA
Abstract :
We report a new nano-switching ESD protection mechanism and dual-polarity Cu/SixOyNz/W nano crossbar array ESD structures. Experiments show full ESD protection featuring fast response of 100pS, ultra low leakage of <;2pA and ESD protection of >9A. New dispersed local ESD tunneling model and CMOS integration are reported.
Keywords :
CMOS integrated circuits; copper; electrostatic discharge; silicon compounds; tungsten; CMOS integration; Cu-SixOyNz-W; ESD protection structure; dispersed local ESD tunneling model; dual-polarity nanocrossbar array ESD structure; nanoswitching crossbar array; Arrays; Electrostatic discharges; Nanoscale devices; Periodic structures; Silicon; Switches; Tunneling; ESD protection; nano switching array;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2013 IEEE
Conference_Location :
Seattle, WA
Print_ISBN :
978-1-4673-6059-3
DOI :
10.1109/RFIC.2013.6569612