• DocumentCode
    625731
  • Title

    Wide-angle camera distortion correction using neural back mapping

  • Author

    Ching-Han Chen ; Tun-Kai Yao ; Chia-Ming Kuo

  • fYear
    2013
  • fDate
    3-6 June 2013
  • Firstpage
    171
  • Lastpage
    172
  • Abstract
    This study proposes an efficient back mapping model that uses a lightweight neural network and virtual calibration plate to accurately correct the distortion of low quality wide angle camera. Unlike the radial model, the neural-based method uses non-linear functional mapping to model surface distortion, which consists of wide-angle distortion and various manufacturing errors in low-cost cameras. The proposed approach uses a lightweight multilayer feed-forward neural network (MFFNN) with error back-propagation training algorithm to map the complex distortion surface. The optimal number of neurons of hidden layer was assigned as 4 for associating the mapping model between the distortion image space (DIS) with the correction image space (CIS). This study uses a 105 degree wide-angle low-cost camera to test the proposed method. Results show that the maximal corrected error in a whole image is less than 2 pixels, and that the mean square error (MSE) approaches 0.2542 between the corrected and ideal results.
  • Keywords
    backpropagation; calibration; cameras; distortion; image processing; mean square error methods; multilayer perceptrons; nonlinear functions; CIS; DIS; MFFNN; MSE; complex distortion surface mapping; correction image space; distortion image space; error back-propagation training algorithm; hidden layer neurons; lightweight multilayer feed-forward neural network; manufacturing errors; mean square error; neural back mapping model; nonlinear functional mapping; surface distortion; virtual calibration plate; wide-angle camera distortion correction; Adaptive optics; Cameras; Lenses; Manufacturing; Nonlinear distortion; Optical distortion; Optical imaging;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Consumer Electronics (ISCE), 2013 IEEE 17th International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    0747-668X
  • Print_ISBN
    978-1-4673-6198-9
  • Type

    conf

  • DOI
    10.1109/ISCE.2013.6570168
  • Filename
    6570168