Experimental investigation on sheet electron beam transport with Electron Beam Measuring and Analyzing System developed in IECAS

Author

Cunjun Ruan ; Qingsheng Li ; Shuzhong Wang ; Xiudong Yang ; Xunlei Wu ; Chongshan Li

Author_Institution

Key Lab. of High Power Microwave Sources & Technol., Inst. of Electron., Beijing, China

fYear

2013

fDate

21-23 May 2013

Firstpage

1

Lastpage

2

Abstract

Recently, a set of instrument named Electron Beam Measuring and Analyzing System (EBMAS) has being built in Institute of Electronics, Chinese Academy of Sciences (IECAS), which can be used to measure the dynamic parameters for the high power electron beam during its formation and transport for microwave vacuum electron devices. In this paper, the EBMAS with its measurement of cross section, current density, energy dispersion, and its three dimensional trajectory with data acquisition and processing system are introduced for the high power electron beam. Then, the instrument is used to measure and analyze the sheet electron beam transport and theirs Diocotron instabilities for the W-band sheet beam klystron developed in IECAS, the thorough experiment results are presented, and good agreement are obtained for the experiment and simulation results.

Keywords

current density; data acquisition; electron beam focusing; electron beams; millimetre wave tubes; optical klystrons; particle beam dynamics; Diocotron instabilities; EBMAS; Electron Beam Measuring and Analyzing System; IECAS; Institute of Electronics Chinese Academy of Sciences; W-band sheet beam klystron; cross section measurement; current density; data acquisition; energy dispersion; high power electron beam; microwave vacuum electron devices; processing system; sheet electron beam transport; three dimensional trajectory; Density measurement; Electron beams; Instruments; Magnetic fields; Microwave measurement; Power measurement; Trajectory; Diocotron instabilities; EBMAS; WSBK; cross section; current density; sheet electron beam; transport;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International

Conference_Location

Paris

Print_ISBN

978-1-4673-5976-4

Type

conf

DOI

10.1109/IVEC.2013.6570895

Filename

6570895