• DocumentCode
    625960
  • Title

    Reliability of TWTAs and MPMs in orbit

  • Author

    Jimenez, Elena Gallego ; Jaumann, Guenther

  • Author_Institution
    TESAT Spacecom, Germany
  • fYear
    2013
  • fDate
    21-23 May 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    TESAT presents the achieved reliability of its TWTAs and MPMs in orbit. Various breakdowns such as SINGLE vs. DUAL units or TWTAs vs. MPMs are presented and discussed. A comparison with the standard reliability analysis based on parts count/stress indicates significantly better reliability in orbit.
  • Keywords
    circuit reliability; travelling wave amplifiers; MPM; TESAT; TWTA; dual breakdowns unit; orbit; single breakdowns unit; standard reliability analysis; Estimation; Orbits; Redundancy; Satellites; Standards; Stress; Fit Rates for TWTAs; In-Orbit Reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5976-4
  • Type

    conf

  • DOI
    10.1109/IVEC.2013.6570900
  • Filename
    6570900
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=625960