Title :
Influence of the incident angle on energy dependence of a secondary electron emission yield
Author :
Bundaleski, N. ; Belhaj, M. ; Gineste, T. ; Teodoro, O.M.N.D.
Author_Institution :
Dept. de Fis., Univ. Nova de Lisboa, Caparica, Portugal
Abstract :
A novel method for calculation of energy dependence of a secondary electron emission yield for different incidence angles is proposed. The model is based on the semi-empirical law for secondary electron yield and a Monte Carlo simulation of reflected primary energy. Initial tests show good agreement between the model and the experiment.
Keywords :
Monte Carlo methods; secondary electron emission; Monte Carlo simulation; energy dependence; incidence angles; reflected primary energy; secondary electron emission yield; semiempirical law; Abstracts; Electron emission; Erbium; Materials; Monte Carlo methods; Silver; Stress; Monte-Carlo simulation; electron emission; electron-solid interaction; semi-empirical formula;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6570958
