• DocumentCode
    626001
  • Title

    Lifetime and reliability analysis of klystrons

  • Author

    Balkcum, Adam ; Habermann, Thomas

  • Author_Institution
    Commun. & Power Ind. Inc., Palo Alto, CA, USA
  • fYear
    2013
  • fDate
    21-23 May 2013
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    Repair histories for nearly 1,700 klystrons of four fundamentally different design types and applications have been monitored for up to 22 years. Statistical analysis of the failure data indicate mean time between failure values at the 90% confidence level ranging from 18 to 63 field service years for these devices.
  • Keywords
    klystrons; reliability; statistical analysis; klystrons; lifetime analysis; reliability analysis; statistical analysis; Cathodes; Hazards; History; Klystrons; Maintenance engineering; Monitoring; Reliability; MTBF; klystron;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5976-4
  • Type

    conf

  • DOI
    10.1109/IVEC.2013.6570967
  • Filename
    6570967
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=626001