DocumentCode
626013
Title
Dielectric enhancement of electric fields for a noble cold cathode
Author
Chung, M.S. ; Chun, J.P. ; Mayer, Arnaldo ; Miskovsky, N.M. ; Cutler, P.H.
Author_Institution
Dept. of Phys., Univ. of Ulsan, Ulsan, South Korea
fYear
2013
fDate
21-23 May 2013
Firstpage
1
Lastpage
2
Abstract
Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.
Keywords
cathodes; electric breakdown; dielectric enhancement; electric fields; field enhancements; field exhibited enhancements; metal-dielectric contact; noble cold cathode; quadruple junction; triple junction; Cathodes; Dielectrics; Educational institutions; Electric breakdown; Electric fields; Junctions; Metals; cold cathode; field emission; field enhancement; metal-dielectric contact; triple junction;
fLanguage
English
Publisher
ieee
Conference_Titel
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location
Paris
Print_ISBN
978-1-4673-5976-4
Type
conf
DOI
10.1109/IVEC.2013.6570981
Filename
6570981
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