Title :
Dielectric enhancement of electric fields for a noble cold cathode
Author :
Chung, M.S. ; Chun, J.P. ; Mayer, Arnaldo ; Miskovsky, N.M. ; Cutler, P.H.
Author_Institution :
Dept. of Phys., Univ. of Ulsan, Ulsan, South Korea
Abstract :
Electric fields at metal-dielectric contact were calculated analytically and numerically. The obtained field exhibited enhancements strong enough to cause breakdown at a triple junction and more apparently at a quadruple junction. Such field enhancements may lead to a noble type of cold cathode.
Keywords :
cathodes; electric breakdown; dielectric enhancement; electric fields; field enhancements; field exhibited enhancements; metal-dielectric contact; noble cold cathode; quadruple junction; triple junction; Cathodes; Dielectrics; Educational institutions; Electric breakdown; Electric fields; Junctions; Metals; cold cathode; field emission; field enhancement; metal-dielectric contact; triple junction;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6570981
