Effects of random circuit fabrication errors on the mean and standard deviation of small signal gain and phase in a traveling wave tube

Author

Rittersdorf, I.M. ; Antonsen, Thomas M. ; Chernin, D. ; Lau, Y.Y.

Author_Institution

Dept. of Nucl. Eng. & Radiol. Sci., Univ. of Michigan, Ann Arbor, MI, USA

fYear

2013

fDate

21-23 May 2013

Firstpage

1

Lastpage

2

Abstract

This paper summarizes a calculation of the mean and standard deviation of the small signal gain and phase of a TWT in the presence of small random, axially varying perturbations in the circuit phase velocity using numerical and analytic approaches. The analytical results compare favorably with results from numerical computations in the absence of space charge effects. The effects of small pitch errors in a 210 GHz folded waveguide TWT are evaluated in an example.

Keywords

numerical analysis; travelling wave tubes; circuit phase velocity; folded waveguide TWT; frequency 210 GHz; numerical approaches; pitch errors; random circuit fabrication errors effects; small signal gain; small signal phase; space charge effects; standard deviation; traveling wave tube; Differential equations; Educational institutions; Electron tubes; Fabrication; Space charge; Standards; fabrication tolerance; gain variation; phase variation; traveling wave tube;

fLanguage

English

Publisher

ieee

Conference_Titel

Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International

Conference_Location

Paris

Print_ISBN

978-1-4673-5976-4

Type

conf

DOI

10.1109/IVEC.2013.6571002

Filename

6571002