Title :
High average power field emitter cathode and testbed for X/Ku-band cold cathode TWT
Author :
Whaley, David ; Duggal, Ramon ; Armstrong, Carter ; Holland, Christopher ; Spindt, Capp ; Thibert, David
Author_Institution :
Electron Devices Div., L-3 Commun., San Carlos, CA, USA
Abstract :
A new field emitter geometry that utilizes a dielectric shield between the emitter tip and gate has been optimized to eliminate flashover in the cathode emitter cavities and improve cathode reliability. A high average power testbed has been designed and fabricated to test these cathodes at currents and current densities required for TWT operation in the X/Ku-Band frequency regime. Experimental tests in the water-cooled testbed demonstrated a record 100 hours of CW operation at 100 mA. A 200 mA X/KuBand TWT was designed to integrate these cathodes and to provide RF gain and power across the entire 6 - 18 GHz frequency band. Preliminary results taken at a cathode current of 50 mA show excellent focus of the emittance-dominated electron beam. RF results at 50 mA demonstrated positive gain over the entire frequency band with a maximum of 13.5 dB gain and 10 W output power at 10 GHz and low duty. Cathode testing as well as TWT design and preliminary operation will be described.
Keywords :
cathodes; electron field emission; testing; travelling wave tubes; Ku-band cold cathode TWT; X-band cold cathode TWT; cathode emitter cavity; cathode reliability; cathode testing; current 100 mA; current 200 mA; current 50 mA; emittance dominated electron beam; flashover elimination; frequency 6 GHz to 18 GHz; gain 13.5 dB; high average power field emitter cathode; power 10 W; preliminary operation; time 100 hr; travelling wave tube; water-cooled testbed; Cathodes; Current density; Electron beams; Gain; Geometry; Radio frequency; Testing; cathode test chamber; cold cathode TWT; field emitter cathode;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6571009