• DocumentCode
    626092
  • Title

    Unique multi-physics approach of self phase locked magnetron (SPLM) system with CST STUDIO SUITE™

  • Author

    SeungWon Baek ; Balk, Monika ; Kiho Kim ; Hyungjong Kim ; JinJoo Choi

  • Author_Institution
    CST of America, San Mateo, CA, USA
  • fYear
    2013
  • fDate
    21-23 May 2013
  • Firstpage
    1
  • Lastpage
    3
  • Abstract
    In recent years, many types of Vacuum tubes have been successfully modeled using simulation codes. However, there wasn´t a complete solution which is suitable for multi-physics problem and is embedded in various industry standard workflows through integrated design environment which gives access to the entire range of numerical technology. CST STUDIO SUITE® provides engineers and researchers with a number of tools to tackle a wide range of challenging problems: CST EM STUDIO® for static and quasi-static simulations, CST MICROWAVE STUDIO® for transient and time-harmonic simulations, CST PARTICLE STUDIO® for the simulation of charged particle dynamics and CST MPHSICS STUDIO® offers a number of solvers to allow optimal performance for thermal and mechanical stress analysis. Each STUDIO for a given problem. Additional features such as GPU and MPI computing are available for accelerating the simulations.
  • Keywords
    electrical engineering computing; magnetrons; vacuum tubes; CST EM STUDIO®; CST MICROWAVE STUDIO®; CST MPHSICS STUDIO®; CST PARTICLE STUDIO®; CST STUDIO SUITE®; CST STUDIO SUITE™; GPU computing; MPI computing; SPLM; charged particle dynamics; mechanical stress analysis; quasistatic simulations; self phase locked magnetron; simulation codes; time-harmonic simulations; vacuum tubes; Computational modeling; Magnetomechanical effects; Magnetostatics; Microwave communication; Microwave oscillators; Microwave ovens; CST MICROWAVE STUDIO®; CST STUDIO SUITE®; GPU and MPI; Magnetron; Self Phase Locked; Simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4673-5976-4
  • Type

    conf

  • DOI
    10.1109/IVEC.2013.6571084
  • Filename
    6571084