Title :
Electrostatic focusing for a field emission electron source
Author :
Jabotinski, Vadim ; Khanh Nguyen ; Pasour, John ; Levush, Baruch ; Abe, D. ; Petillo, John
Author_Institution :
Beam-Wave Res., Inc., Bethesda, MD, USA
Abstract :
This paper presents theory and analysis of single-tip field emission and electron beam propagation in the electrostatic focusing fields. It is shown that two gate apertures with a focusing anode allow transport of narrow electron beams over long distances without need for a confining magnetic field. Physical mechanisms of the beam formation, transport, intrinsic emittance with thermal effects, the effects of the emission properties, and parametric studies are discussed, and a new concept and model of the bandgap-spread multilevel field emission is given.
Keywords :
anodes; electric fields; electron beam focusing; electron beams; electron field emission; electron sources; bandgap-spread multilevel field emission; beam formation; electron beam propagation; electrostatic focusing fields; emission properties effects; field emission electron source; focusing anode; gate apertures; intrinsic emittance; narrow electron beam transport; parametric studies; single-tip field emission; Anodes; Electron beams; Electrostatics; Focusing; Geometry; Logic gates; Periodic structures; Fowler-Nordheim; electron beam; electrostatic focusing; field emission; field emitter array; periodic waveguiding structure; terahertz;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6571147