Title :
Experimental investigation of the influence of electron incidence angle on the Total Electron Emission Yield of silver
Author :
Gineste, T. ; Belhaj, M. ; Bundaleski, N. ; Teodoro, O.M.N.D. ; Pons, Christiane ; Puech, J. ; Balcon, Nicolas
Author_Institution :
DESP (Dept. Environ. SPatial), ONERA, Toulouse, France
Abstract :
The influence of the incident angle on Total Emission Electron Yield (TEEY) was experimentally investigated on technical silver. The increase of the TEEY with incidence angle, which strongly depends on the incident energy, was observed. The experimental observations generally agree with the new model presented in this conference.
Keywords :
electron emission; TEEY; electron incidence angle; incident energy; technical silver; total electron emission yield; Electron beams; Electron emission; Energy measurement; Materials; Pollution measurement; Silver; Surface morphology; Silver; backscattered electron; incidence angle effect on electron emission; multipactor effect; secondary electron emission;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6571182
