Title :
Experimental measurement of W-band backward-wave amplification driven by external pulsed signals
Author :
Chan-Wook Baik ; Ho Young Ahn ; Yongsung Kim ; Jooho Lee ; Seogwoo Hong ; Sanghun Lee ; Junhee Choi ; Sunil Kim ; Collins, George A. ; Ives, L. ; Sungwoo Hwang
Author_Institution :
Samsung Adv. Inst. of Technol., Yongin, South Korea
Abstract :
The experimental implementation of W-band backward-wave oscillator is achieved by using a multilevel microfabrication of interaction circuit including beam tunnel, slow-wave structure, and output transition, on deep reactive ion etched (DRIE) and metal deposited silicon wafers. The interaction circuit shows precise accuracy in full 3 dimensions, and the return loss measurement agrees well with HFSS simulation. Here we describe the experimental observation of W-band backward-wave oscillation and amplification after successful vacuum sealed integration of interaction circuit, electron gun, beam collector, and output window.
Keywords :
amplification; backward wave oscillators; electron guns; microfabrication; millimetre wave tubes; slow wave structures; sputter etching; DRIE; HFSS simulation; W-band backward-wave amplification; W-band backward-wave oscillator; beam collector; beam tunnel; deep reactive ion etching; electron gun; external pulsed signals; interaction circuit; metal deposited silicon wafers; multilevel microfabrication; output window; return loss measurement; vacuum sealed integration; Accuracy; Cavity resonators; Fabrication; Integrated circuit modeling; Loss measurement; Oscillators; Radio frequency; DRIE; MEMS; W-band; amplification; backward wave; interaction circuit; microfabrication; oscillation; slow-wave structure;
Conference_Titel :
Vacuum Electronics Conference (IVEC), 2013 IEEE 14th International
Conference_Location :
Paris
Print_ISBN :
978-1-4673-5976-4
DOI :
10.1109/IVEC.2013.6571183
