Title :
Time-Effective Lab Characterization on Voltage Regulators without Compromising the Evaluation Quality
Author :
Rajamanickam, Sivasankaran ; Jamil, Nursuriati ; Piccinelli, Mario ; Giarin, Matteo
Author_Institution :
ATV Product Eng., Infineon Technol. (M) Sdn Bhd, Batu Berendam, Malaysia
Abstract :
The core of semiconductor companies is product and technology development to bear the competitiveness. One of the criteria in product development is electrical lab characterization which is crucial in validating the device´s electrical functionality without jeopardizing the evaluation quality and ensuring that it is within the product specifications. Typical lab characterization takes longer time to complete since it is deploying the manual measurement method. In order to unravel these efforts, a custom-made test board named general purpose board (GPB) is designed with the capability to fulfil the entire coverage of datasheet test parameters for lab characterization. The GPB hardware supports characterization for voltage regulators which come in various device packages. Serial Peripheral Interface (SPI) drives the relays on the motherboard and relay matrix concept is applied to swap the testing parameter setup from one state to another. This paper discusses the time-effective, quality assured lab characterization approach on voltage regulators.
Keywords :
driver circuits; measurement systems; peripheral interfaces; printed circuit testing; product development; relays; voltage regulators; GPB; SPI; custom-made test board; datasheet test parameter setup; device packaging; evaluation quality; general purpose board; manual measurement method; motherboard; product development; product specification; relay matrix concept; semiconductor company; serial peripheral interface drive; time-effective electrical lab characterization; voltage regulator; Manuals; Regulators; Relays; Software; Time measurement; Voltage control; Voltage measurement; automated measurement; evaluation quality; general purpose board; lab characterization; testing parameters;
Conference_Titel :
Computational Intelligence, Communication Systems and Networks (CICSyN), 2013 Fifth International Conference on
Conference_Location :
Madrid
Print_ISBN :
978-1-4799-0587-4
DOI :
10.1109/CICSYN.2013.36