Title :
Combinatorial Coverage Measurement Concepts and Applications
Author :
Kuhn, D. Rick ; Dominguez Mendoza, Itzel ; Kacker, Raghu N. ; Yu Lei
Author_Institution :
Stand. & Technol., Gaithersburg, MD, USA
Abstract :
Empirical data demonstrate the value of t-way coverage, but in some testing situations, it is not practical to use covering arrays. However any set of tests covers at least some proportion of t-way combinations. This paper describes a variety of measures of combinatorial coverage that can be used in evaluating aspects of t-way coverage of a test suite. We also provide lower bounds on t-way coverage of several widely-used testing strategies, and describe a tool that analyzes test suites using the measures discussed in the paper.
Keywords :
combinatorial mathematics; program testing; combinatorial coverage measurement concept; covering arrays; t-way combination; t-way coverage; test suite; Conferences; Measurement; Organizations; Software; Standards organizations; Testing; component; combinatorial testing; factor covering array; state-space coverage; verification and validation (V&V); tway testing; configuration model; t-way testing;
Conference_Titel :
Software Testing, Verification and Validation Workshops (ICSTW), 2013 IEEE Sixth International Conference on
Conference_Location :
Luxembourg
Print_ISBN :
978-1-4799-1324-4
DOI :
10.1109/ICSTW.2013.77
