Title :
Frequency compensation of high-speed, low-voltage CMOS multistage amplifiers
Author :
Aamir, Syed Ahmed ; Harikumar, Prakash ; Wikner, J. Jacob
Author_Institution :
Dept. of Electr. Eng., Linkoping Univ., Linköping, Sweden
Abstract :
This paper presents the frequency compensation of high-speed, low-voltage multistage amplifiers. Two frequency compensation techniques, the Nested Miller Compensation with Nulling Resistors (NMCNR) and Reversed Nested Indirect Compensation (RNIC), are discussed and employed on two multistage amplifier architectures. A four-stage pseudo-differential amplifier with CMFF and CMFB is designed in a 1.2 V, 65-nm CMOS process. With NMCNR, it achieves a phase margin (PM) of 59° with a DC gain of 75 dB and unity-gain frequency (fug) of 712 MHz. With RNIC, the same four-stage amplifier achieves a phase margin of 84°, DC gain of 76 dB and fug of 2 GHz. Further, a three-stage single-ended amplifier is designed in a 1.1-V, 40-nm CMOS process. The three-stage OTA with RNIC achieves PM of 81°, DC gain of 80 dB and fug of 770 MHz. The same OTA achieves PM of 59° with NMCNR, while maintaining a DC gain of 75 dB and fug of 262 MHz. Pole-splitting, to achieve increased stability, is illustrated for both compensation schemes. Simulations illustrate that the RNIC scheme achieves much higher PM and fug for lower values of compensation capacitance compared to NMCNR, despite the growing number of low voltage amplifier stages.
Keywords :
CMOS analogue integrated circuits; MMIC amplifiers; UHF amplifiers; differential amplifiers; field effect MMIC; low-power electronics; operational amplifiers; CMOS process; NMCNR; RNIC; frequency 2 GHz; frequency 262 MHz; frequency 712 MHz; frequency compensation; gain 76 dB; high-speed multistage amplifier; low voltage CMOS multistage amplifier; nested Miller compensation; nulling resistor; pole splitting; pseudodifferential amplifier; reversed nested indirect compensation; size 40 nm; size 65 nm; three stage OTA; voltage 1.1 V; voltage 1.2 V; CMOS integrated circuits; CMOS process; Capacitance; Gain; Poles and zeros; Resistors; Transistors;
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4673-5760-9
DOI :
10.1109/ISCAS.2013.6571860