DocumentCode
626576
Title
3D stacking for multi-core architectures: From WIDEIO to distributed caches
Author
Clermidy, F. ; Dutoit, Denis ; Guthmuller, E. ; Miro-Panades, Ivan ; Vivet, Pascal
Author_Institution
CEA-LETI, Grenoble, France
fYear
2013
fDate
19-23 May 2013
Firstpage
537
Lastpage
540
Abstract
3D stacking has been viewed as a breakthrough solution for increasing performance in multi-core architectures. The hope is to solve some of the main issues in current multi-core architectures: external memory pressure and latency; I/O bottleneck; communication power consumption. In this paper, some advances of this field of research are shown, starting with a WIDEIO experience on a real chip for solving DRAM accesses issue. The integration of a 512 bit-width bus is demonstrated in a Network-on-Chip (NoC) multi-core framework and the resulting performance based on a 65nm prototype with 10μm diameter Through Silicon Vias (TSV). The potentiality of 3D scaling thanks to 3D asynchronous Network-on-Chip implementation is then shown. Finally, an innovative 3D stacked distributed cache strategy aimed at lowering memory latency and external memory bandwidth requirements is presented. This new memory partitioning demonstrates the efficiency of 3D stacking to rethink architectures for addressing multi-core scaling challenges.
Keywords
DRAM chips; cache storage; logic partitioning; network-on-chip; three-dimensional integrated circuits; 3D asynchronous network-on-chip implementation; 3D scaling; 3D stacked distributed cache strategy; 3D stacking; DRAM access; I/O bottleneck; WIDEIO; communication power consumption; memory bandwidth requirements; memory latency; memory partitioning; memory pressure; multicore architectures; multicore scaling challenges; network-on-chip multicore framework; size 10 mum; size 65 nm; through silicon vias; word length 512 bit; Bandwidth; Memory management; Process control; Stacking; Through-silicon vias; Tiles;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location
Beijing
ISSN
0271-4302
Print_ISBN
978-1-4673-5760-9
Type
conf
DOI
10.1109/ISCAS.2013.6571899
Filename
6571899
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