• DocumentCode
    626625
  • Title

    LSGP: Line-SIFT Geometric Pattern for wide-baseline image matching

  • Author

    Heng Liu ; Xuejin Chen ; Jiawei Zhang ; Zhefu Tu

  • Author_Institution
    Dept. of Electr. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Hefei, China
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    721
  • Lastpage
    724
  • Abstract
    In this paper, a novel descriptor - Line-SIFT Geometric Pattern (LSGP) is proposed for wide-baseline image matching. In this descriptor, the geometry relationship between a line segment and its neighboring SIFT features is used to describe the line segments. By measuring the similarities between line segments, we could find line correspondences between multiple images which embed more intuitive information for further application such as 3D reconstruction. The experiment results have proved that our LSGP descriptor has good performance under various conditions.
  • Keywords
    image matching; image reconstruction; 3D reconstruction; LSGP; LSGP descriptor; SIFT features; line segment; line-SIFT geometric pattern; wide-baseline image matching; Computer vision; Feature extraction; Geometry; Image reconstruction; Image segmentation; Lighting; Robustness;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6571948
  • Filename
    6571948