DocumentCode
626625
Title
LSGP: Line-SIFT Geometric Pattern for wide-baseline image matching
Author
Heng Liu ; Xuejin Chen ; Jiawei Zhang ; Zhefu Tu
Author_Institution
Dept. of Electr. Eng. & Inf. Sci., Univ. of Sci. & Technol. of China, Hefei, China
fYear
2013
fDate
19-23 May 2013
Firstpage
721
Lastpage
724
Abstract
In this paper, a novel descriptor - Line-SIFT Geometric Pattern (LSGP) is proposed for wide-baseline image matching. In this descriptor, the geometry relationship between a line segment and its neighboring SIFT features is used to describe the line segments. By measuring the similarities between line segments, we could find line correspondences between multiple images which embed more intuitive information for further application such as 3D reconstruction. The experiment results have proved that our LSGP descriptor has good performance under various conditions.
Keywords
image matching; image reconstruction; 3D reconstruction; LSGP; LSGP descriptor; SIFT features; line segment; line-SIFT geometric pattern; wide-baseline image matching; Computer vision; Feature extraction; Geometry; Image reconstruction; Image segmentation; Lighting; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location
Beijing
ISSN
0271-4302
Print_ISBN
978-1-4673-5760-9
Type
conf
DOI
10.1109/ISCAS.2013.6571948
Filename
6571948
Link To Document