DocumentCode :
62679
Title :
A 28 Gb/s 560 mW Multi-Standard SerDes With Single-Stage Analog Front-End and 14-Tap Decision Feedback Equalizer in 28 nm CMOS
Author :
Kimura, Hiromitsu ; Aziz, Pervez M. ; Tai Jing ; Sinha, Aloka ; Kotagiri, Shiva Prasad ; Narayan, Rohit ; Hairong Gao ; Ping Jing ; Hom, Gary ; Anshi Liang ; Zhang, Enxia ; Kadkol, Aniket ; Kothari, Ruchi ; Chan, Gordon ; Yehui Sun ; Ge, Baoming ; Zeng, J
Author_Institution :
LSI Corp., San Jose, CA, USA
Volume :
49
Issue :
12
fYear :
2014
fDate :
Dec. 2014
Firstpage :
3091
Lastpage :
3103
Abstract :
This paper presents a 28 Gb/s multistandard SerDes macro which is fabricated in TSMC 28 nm CMOS process. The transimpedance amplifier (TIA) base analog front-end achieved 15 dB high-frequency boost with an on-chip compact passive inductor. The adaptation loop for the boost is decoupled from the decision feedback equalizer (DFE) adaptation by the use of a group delay algorithm. The DFE is a half-rate 1-tap unrolled design with only two total error latches for power and area reduction. A two-stage sense amplifier-based latch achieved sensitivity of 15 mV. The high-speed clock buffer uses a PMOS active inductor circuit with common-mode feedback to optimize the circuit performance. The transceiver achieves error-free operation at 28 Gbps with 34 dB channel loss, consumes the worst case power of 560 mW/lane, and fully complies with multiple standards and applications.
Keywords :
CMOS integrated circuits; decision feedback equalisers; flip-flops; operational amplifiers; radio transceivers; 14-tap decision feedback equalizer; DFE adaptation; PMOS active inductor circuit; TIA base analog front-end; TSMC CMOS process; bit rate 28 Gbit/s; boost adaptation loop; channel loss; common-mode feedback; decision feedback equalizer adaptation; error-free operation; group delay algorithm; half-rate 1-tap unrolled design; high-frequency boost; high-speed clock buffer; loss 34 dB; multistandard SerDes macro; on-chip compact passive inductor; power 560 mW; single-stage analog front-end; size 28 nm; total error latches; transceiver; transimpedance amplifier; two-stage sense amplifier-based latch; voltage 15 mV; Bandwidth; Clocks; Couplings; Decision feedback equalizers; Inductors; Phase locked loops; System-on-chip; 28 Gb/s SerDes; Active inductor; TIA-based analog front end; group delay adaptation; unrolled DFE;
fLanguage :
English
Journal_Title :
Solid-State Circuits, IEEE Journal of
Publisher :
ieee
ISSN :
0018-9200
Type :
jour
DOI :
10.1109/JSSC.2014.2349974
Filename :
6894632
Link To Document :
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