DocumentCode :
626808
Title :
0.18 μm CMOS process photodiode memory
Author :
Kubota, Takahide ; Watanabe, Manabu
Author_Institution :
Electr. & Electron. Eng., Shizuoka Univ., Hamamatsu, Japan
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
1464
Lastpage :
1467
Abstract :
Currently, demand for high-speed dynamic reconfiguration of a programmable device is increasing for raising the performance level of such devices. To support high-speed dynamic reconfiguration, optically reconfigurable gate arrays (ORGAs) have been developed to date. An ORGA consists of a holographic memory, a laser array, and an optically reconfigurable gate array VLSI. The holographic memory can store many configuration contexts. Moreover, its large-bandwidth optical connection enables high-speed reconfiguration. Nevertheless, in previously proposed ORGA-VLSIs, the static configuration memory to store a single configuration context consumed a large implementation area of the ORGA-VLSIs and prevented the realization of large-gate-count ORGA-VLSIs. Therefore, a 0.18 μιη CMOS process photodiode memory has been newly fabricated to increase the gate density of ORGAs. The photodiode memory uses the junction capacitance of photodiodes as dynamic memory, thereby obviating the static configuration memory.
Keywords :
CMOS memory circuits; VLSI; photodiodes; CMOS process photodiode memory; high-speed dynamic reconfiguration; holographic memory; large-bandwidth optical connection; large-gate-count ORGA-VLSI; laser array; optically reconfigurable gate array; optically reconfigurable gate arrays; programmable device; size 0.18 mum; static configuration memory; CMOS process; Liquid crystal displays; Very large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
ISSN :
0271-4302
Print_ISBN :
978-1-4673-5760-9
Type :
conf
DOI :
10.1109/ISCAS.2013.6572133
Filename :
6572133
Link To Document :
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