DocumentCode
626867
Title
A LUT-free DC offset calibration method for removing the PGA-gain-correlated offset residue
Author
Lingwei Zhang ; Hanjun Jiang ; Fule Li ; Jingjing Dong ; Zhihua Wang
Author_Institution
Tsinghua Nat. Lab. for Inf. Sci. & Technol., Tsinghua Univ., Beijing, China
fYear
2013
fDate
19-23 May 2013
Firstpage
1704
Lastpage
1707
Abstract
This paper presents a novel DC offset calibration method for the zero-IF (intermediate frequency) receiver that removes the PGA-gain-correlated offset residue. The conventional calibration method is usually based on the classic input/output referred offset model, in which the receiver IF programmable gain amplifiers (PGAs) have offset sources that varies a lot with different gain settings. Consequently, the conventional calibration method needs to generate the calibration code at each gain step and requires a huge look up table (LUT) to store the calibration values. This paper presents a new DC offset model which is gain non-correlated, by analyzing two types of commonly-used PGA. Based on the new model, a LUT-free single-step DC offset calibration method in together with the implementation circuit is designed. The proposed method has been verified on a practical zero-IF receiver circuit in a standard 0.18 μm CMOS technology through the Monte Carlo (MC) simulation. The simulation results show that the receiver IF output offset residue after calibration using the proposed method is reduced to below 12 mV, which is comparable to the LUT-based conventional calibration.
Keywords
CMOS analogue integrated circuits; Monte Carlo methods; amplifiers; calibration; CMOS technology; LUT-free single-step DC offset calibration method; MC simulation; Monte Carlo simulation; PGA-gain-correlated offset residue; classic input-output referred offset model; look up table; programmable gain amplifiers; size 0.18 mum; zero-IF receiver circuit; Calibration; Electronics packaging; Gain; Integrated circuit modeling; Mathematical model; Receivers; Resistors;
fLanguage
English
Publisher
ieee
Conference_Titel
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location
Beijing
ISSN
0271-4302
Print_ISBN
978-1-4673-5760-9
Type
conf
DOI
10.1109/ISCAS.2013.6572192
Filename
6572192
Link To Document