Title : 
Mobility overlap-removal based leakage power aware scheduling in high-level synthesis
         
        
            Author : 
Nan Wang ; Song Chen ; Yuhuan Sun ; Yoshimura, Tetsuzo
         
        
            Author_Institution : 
Grad. Sch. of IPS, Waseda Univ., Japan
         
        
        
        
        
        
            Abstract : 
In this paper, we address the problem of scheduling operations into control steps with dual threshold voltage (dual-Vth) technique under timing and resource constraints. Recently, some scheduling methods are proposed based on the mobility overlap removal, and it is a hard problem to remove the mobility overlap optimally. There might be no feasible solution with an improper mobility overlap removal. In this work, we implement the mobility overlap removal together with dual threshold voltage technique to minimize the total leakage power. A simulated-annealing based method is introduced to explore the optimal solution. For each mobility overlap removal, a probability-based method is proposed to schedule operations at appropriate control steps, and to assign them with proper threshold voltages. The experimental results show the effectiveness of the proposed method.
         
        
            Keywords : 
carrier mobility; high level synthesis; leakage currents; minimisation; power aware computing; probability; simulated annealing; timing; dual threshold voltage technique; dual-Vth technique; high-level synthesis; leakage power aware scheduling; optimal mobility overlap removal; optimal solution; probability-based method; resource constraints; simulated annealing-based method; timing constraints; total leakage power minimization; Delays; Educational institutions; Optimization; Schedules; Scheduling; Threshold voltage;
         
        
        
        
            Conference_Titel : 
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
         
        
            Conference_Location : 
Beijing
         
        
        
            Print_ISBN : 
978-1-4673-5760-9
         
        
        
            DOI : 
10.1109/ISCAS.2013.6572202