A high resolution and high accuracy R-2R DAC based on ordered element matching

Author

You Li ; Tao Zeng ; Degang Chen

Author_Institution

Dept. of Electr. & Comput. Eng., Iowa State Univ., Ames, IA, USA

fYear

2013

fDate

19-23 May 2013

Firstpage

1974

Lastpage

1977

Abstract

Random mismatch errors in the resistor networks are one of the dominant nonlinearity sources for high resolution and high accuracy resistor DACs. This paper applies the theory of ordered element matching in a high resolution segmented R-2R DAC. It can achieve high matching accuracy by regrouping the resistors in the MSB array according to their resistance ranks obtained by the INL test. The implementation only requires adding some additional digital circuits to the typical design. A behavioral model of 18-bit segmented R-2R DAC is created in MATLAB. The statistical results show a significant resistor area reduction compared with state of the art.

Keywords

circuit testing; digital-analogue conversion; network synthesis; resistors; statistical analysis; INL test; MATLAB; MSB array; digital circuit; dominant nonlinearity source; high resolution segmented R-2R DAC; ordered element matching; random mismatch error; resistor network; statistical analysis; word length 18 bit; Accuracy; Arrays; MATLAB; Mathematical model; Registers; Resistors; Standards;

fLanguage

English

Publisher

ieee

Conference_Titel

Circuits and Systems (ISCAS), 2013 IEEE International Symposium on

Conference_Location

Beijing

ISSN

0271-4302

Print_ISBN

978-1-4673-5760-9

Type

conf

DOI

10.1109/ISCAS.2013.6572256

Filename

6572256