DocumentCode :
626974
Title :
Low-noise readout IC with integrated analog-to-digital conversion for radiation detection system
Author :
Yingkan Lin ; Stanacevic, Milutin
Author_Institution :
Dept. of Electr. & Comput. Eng., Stony Brook Univ., Stony Brook, NY, USA
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
2199
Lastpage :
2202
Abstract :
A low-noise readout integrated circuit, comprising a charge sensitive amplifier, a pulse shaper with baseline holder, a peak detector and an A/D converter, is presented. The designed IC quantifies optical response of a large-area epitaxial photodiode integrated on a body of a semiconductor scintillator. The input transistor size and the time constant of the shaper are optimized to obtain a minimum equivalent noise charge(ENC) with the large input load capacitance. A time-based clockless A/D converter is implemented to minimize the interference of the digital part of the readout system on the low-noise charge-sensitive amplifier. The simulated ENC of the readout system interfacing a 50 pF capacitance and a dark current of 10 pA that model the epitaxial photodiode is 172 electrons at 12 μs time constant of the pulse shaper with power consumption of CSA and shaper of 2.2 mW.
Keywords :
amplifiers; analogue-digital conversion; integrated circuit design; photodiodes; pulse shaping circuits; radiation detection; readout electronics; scintillation; CSA; ENC; baseline holder; capacitance; capacitance 50 pF; current 10 pA; dark current; digital part; epitaxial photodiode; integrated analog-to-digital conversion; low-noise charge-sensitive amplifier; low-noise readout IC; low-noise readout integrated circuit; minimum equivalent noise charge; optical response; peak detector; power 2.2 mW; power consumption; pulse shaper; radiation detection system; semiconductor scintillator; time 12 mus; time constant; time-based clockless A/D converter; transistor size; Capacitance; Clocks; Detectors; Epitaxial growth; Noise; Photodiodes; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
ISSN :
0271-4302
Print_ISBN :
978-1-4673-5760-9
Type :
conf
DOI :
10.1109/ISCAS.2013.6572312
Filename :
6572312
Link To Document :
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