• DocumentCode
    626977
  • Title

    Delay-variation-tolerant FIR filter architectures based on the Residue Number System

  • Author

    Kouretas, I. ; Paliouras, Vassilis

  • Author_Institution
    Electr. & Comput. Eng. Dept., Univ. of Patras, Patras, Greece
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    2223
  • Lastpage
    2226
  • Abstract
    This paper investigates the use of the Residue Number System (RNS) in the hardware design of VLSI FIR filters implemented in nano-scale technologies prone to process variation effects. It is here shown that the RNS substantially reduces the filter sensitivity to delay variations, when compared to digital filter designs that use conventional positional number systems, such as the widely-used two´s-complement representation. The inherent tolerance of the introduced RNS architectures to the delay variations, is here shown to allow to circumvent the use of large design parameter margins. Therefore, we demonstrate that the use of RNS can achieve a high timing yield without resorting to costly over-design, which may unnecessarily increase system complexity. The particular benefit comes in addition to area, time and power benefits achieved due to the use of the RNS. The quantitative digital filter design space exploration reported in the paper takes into consideration the filter order as well as criteria related to the filter output signal quality such as the signal-to-noise ratio (SNR) and it demonstrates that the proposed architectures offer effective solutions for hardware design using modern and future nano-scale processes, for filter cases of practical interest.
  • Keywords
    FIR filters; delay circuits; nanotechnology; residue number systems; RNS architectures; SNR; VLSI FIR filters; delay variations; delay-variation-tolerant FIR filter architectures; digital filter design space exploration; filter output signal quality; filter sensitivity; hardware design; large design parameter margins; nano-scale technologies; nanoscale processes; positional number systems; process variation effects; residue number system; signal-to-noise ratio; RNS; Residue arithmetic; arithmetic circuits; variation-tolerant design;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6572318
  • Filename
    6572318