• DocumentCode
    627069
  • Title

    A CMOS 8×8 SPAD array for Time-of-Flight measurement and light-spot statistics

  • Author

    Vornicu, I. ; Carmona-Galan, R. ; Rodriguez-Vazquez, Angel

  • Author_Institution
    Inst. of Microelectron. of Seville (IMSE-CNM), Univ. of Seville, Seville, Spain
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    2626
  • Lastpage
    2629
  • Abstract
    The design and simulation of a CMOS 8 × 8 single photon avalanche diode (SPAD) array is presented. The chip has been fabricated in a 0.18μm standard CMOS technology and implements a double functionality: measuring the Time-of-Flight with the help of a pulsed light source; or computing focal-plane statistics in biomedical imaging applications based on a concentrated light-spot. The incorporation of on-chip processing simplifies the interfacing of the array with the host system. The pixel pitch is 32μm, while the diameter of the quasi-circular active area of the SPADs is 12μm. The 113μm2 active area is surrounded by a T-well guard ring. The resulting breakdown voltage is 10V with a maximum excess voltage of 1.8V. The pixel incorporates a novel active quenching/reset circuit. The array has been designed to operate with a laser pulsed at 20Mhz. The overall time resolution is 115ps. Focal-plane statistics are obtained in digital format. The maximum throughput of the digital output buffers is 200Mbps.
  • Keywords
    CMOS integrated circuits; avalanche diodes; biomedical imaging; focal planes; light sources; CMOS SPAD array; T-well guard ring; active quenching-reset circuit; biomedical imaging; double functionality; focal-plane statistics; light-spot statistics; on-chip processing; pulsed light source; quasicircular active area; single photon avalanche diode; size 0.18 mum; size 12 mum; time-of-flight measurement; Anodes; Arrays; CMOS integrated circuits; Photonics; Positron emission tomography; Radiation detectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6572417
  • Filename
    6572417