DocumentCode :
627070
Title :
Velocity saturation current-mode CMOS imaging sensor
Author :
Njuguna, Raphael ; Gruev, Viktor
Author_Institution :
Dept. of Comput. Sci. & Eng., Washington Univ. in St. Louis, St. Louis, MO, USA
fYear :
2013
fDate :
19-23 May 2013
Firstpage :
2630
Lastpage :
2633
Abstract :
A current-mode CMOS imaging sensor is presented in this paper. The read-out transistor in the photo pixel operates in velocity saturation regime and allows for high linearity between integrated photo charges and output drain current. The column parallel read-out circuitry implements a novel current conveyor with a feedback mechanism which improves matching of the output currents across the imaging array. Correlated double sampling (CDS) is performed on-chip in order to improve noise characteristics of the imager. A prototype of the proposed imaging sensor was fabricated in 0.18μm triple well CMOS process. The sensor operation and measurements are presented.
Keywords :
CMOS image sensors; current-mode circuits; image sampling; readout electronics; CDS; column parallel readout circuitry; correlated double sampling; current mode CMOS imaging sensor; imaging array; integrated photo charges; output drain current; photo pixel; readout transistor; size 0.18 mum; velocity saturation regime; Arrays; CMOS integrated circuits; Electric potential; Imaging; Linearity; Noise; Transistors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
Conference_Location :
Beijing
ISSN :
0271-4302
Print_ISBN :
978-1-4673-5760-9
Type :
conf
DOI :
10.1109/ISCAS.2013.6572418
Filename :
6572418
Link To Document :
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