• DocumentCode
    627070
  • Title

    Velocity saturation current-mode CMOS imaging sensor

  • Author

    Njuguna, Raphael ; Gruev, Viktor

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Washington Univ. in St. Louis, St. Louis, MO, USA
  • fYear
    2013
  • fDate
    19-23 May 2013
  • Firstpage
    2630
  • Lastpage
    2633
  • Abstract
    A current-mode CMOS imaging sensor is presented in this paper. The read-out transistor in the photo pixel operates in velocity saturation regime and allows for high linearity between integrated photo charges and output drain current. The column parallel read-out circuitry implements a novel current conveyor with a feedback mechanism which improves matching of the output currents across the imaging array. Correlated double sampling (CDS) is performed on-chip in order to improve noise characteristics of the imager. A prototype of the proposed imaging sensor was fabricated in 0.18μm triple well CMOS process. The sensor operation and measurements are presented.
  • Keywords
    CMOS image sensors; current-mode circuits; image sampling; readout electronics; CDS; column parallel readout circuitry; correlated double sampling; current mode CMOS imaging sensor; imaging array; integrated photo charges; output drain current; photo pixel; readout transistor; size 0.18 mum; velocity saturation regime; Arrays; CMOS integrated circuits; Electric potential; Imaging; Linearity; Noise; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Circuits and Systems (ISCAS), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • ISSN
    0271-4302
  • Print_ISBN
    978-1-4673-5760-9
  • Type

    conf

  • DOI
    10.1109/ISCAS.2013.6572418
  • Filename
    6572418