Title :
A 60 GHz tunable LNA in 32 nm double gate MOSFET for a wireless NoC architecture
Author :
Laha, Soumyasanta ; Kaya, Savas ; Kodi, Avinash ; DiTomaso, Dominic ; Matolak, David
Author_Institution :
Sch. of Electr. Eng. & Comput. Sci., Ohio Univ., Athens, OH, USA
Abstract :
The performance, tunability and efficiency of double gate MOSFET (DG-MOSFET) low noise amplifier (LNA) is investigated. We propose a novel two-stage common source cascode LNA and study its gain switching properties via back gate tuning in 32 nm DG-MOSFETs that leads to variable and reconfigurable device performances not found in comparable amplifiers built with conventional CMOS architectures without additional hardware. The peak gain changes by almost 9 dB from 6 dB to 14.9 dB for back gate biases of 0.3 V and 0.7 V respectively. The 3-dB bandwidth ranges from 60 - 75 GHz. The noise figure of the LNA varies from 6.8 dB at 0.7 V to 12 dB at 0.3 V. The maximum dissipated power is 12 mW for 1.2 V supply. The minimum 3rd order input intercept point is found to be - 5.1 dBm. These performance parameters are either comparable or better to some of the recent LNA designs in ~60 GHz frequency at different technologies compared in this text. Finally, we briefly illustrate the application of this DG-MOSFET gain tuning LNA for a Wireless Network on Chip architecture.
Keywords :
MOSFET; low noise amplifiers; millimetre wave amplifiers; millimetre wave field effect transistors; network-on-chip; 3rd order input intercept point; DG-MOSFET LNA; bandwidth 60 GHz to 75 GHz; double gate MOSFET; double gate MOSFET low noise amplifier; frequency 60 GHz; gain switching properties; noise figure 0.8 dB to 12 dB; power 12 mW; reconfigurable device performances; size 32 nm; tunable LNA; two-stage common source cascode LNA; voltage 0.3 V; voltage 0.7 V; voltage 1.2 V; wireless NoC architecture; wireless network on chip architecture; CMOS integrated circuits; CMOS technology; FinFETs; Gain; Logic gates; Noise measurement; Tuning;
Conference_Titel :
Wireless and Microwave Technology Conference (WAMICON), 2013 IEEE 14th Annual
Conference_Location :
Orlando, FL
Print_ISBN :
978-1-4673-5536-0
Electronic_ISBN :
978-1-4673-5535-3
DOI :
10.1109/WAMICON.2013.6572763