• DocumentCode
    627418
  • Title

    A glimpse on behavioral modeling technology for microwave transistors

  • Author

    Pedro, Jose C.

  • Author_Institution
    Inst. de Telecomunicayoes, Univ. de A veiro, A veiro, Portugal
  • fYear
    2013
  • fDate
    7-9 April 2013
  • Firstpage
    1
  • Lastpage
    6
  • Abstract
    Although many generations of microwave transistors have continuously fed a never ending effort of both physical and equivalent circuit device modeling, many microwave engineers have recently turned their attention to behavioral modeling. Behavioral models are measurement-based mathematical representations of the observable inputoutput characteristics of devices, regardless of their technology or of their internal composition. Therefore, not only they protect the intellectual property of the device´s manufacturer, as they are only limited by the available laboratory measurement based capabilities. Unfortunately, they also require a great deal of ingenuity in the model formulation and their predictive capability is generally worse than the one of physics-based models. The aim of this paper is to present an overview of microwave transistor behavioral models addressing their mathematical formulation and their laboratory parameter extraction procedures. Both time-domain and frequency-domain behavioral models are addressed, giving a particular emphasis on the implementations that have seen a wider acceptance.
  • Keywords
    microwave transistors; behavioral modeling technology; equivalent circuit; laboratory parameter extraction; mathematical formulation; microwave transistors; physical circuit; Jacobian matrices; Microwave measurement; Neural networks; Time-domain analysis; Time-frequency analysis; Behavioral modeling; microwave transistors; nonlinear system identification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Wireless and Microwave Technology Conference (WAMICON), 2013 IEEE 14th Annual
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4673-5536-0
  • Electronic_ISBN
    978-1-4673-5535-3
  • Type

    conf

  • DOI
    10.1109/WAMICON.2013.6572773
  • Filename
    6572773