Title :
Comprehensive Modeling and Experimental Testing of Fault Detection and Management of a Nonredundant Fault-Tolerant VSI
Author :
Cecati, Carlo ; Di Tommaso, Antonino Oscar ; Genduso, Fabio ; Miceli, Rosario ; Ricco Galluzzo, Giuseppe
Author_Institution :
Dept. of Inf. Eng., Univ. of L´Aquila, L´Aquila, Italy
Abstract :
This paper presents an investigation and a comprehensive analysis on fault operations in a conventional three-phase voltage source inverter. After an introductory section dealing with power converter reliability and fault analysis issues in power electronics, a generalized switching function accounting for both healthy and faulty conditions and an easy and feasible method to embed fault diagnosis and reconfiguration within the control algorithm are introduced. The proposed system has simple and compact implementation. Experimental results operating both at open- and closed-loop current control, obtained using a test bench realized using a dSPACE system and the fault-tolerant inverter prototype demonstrate that the proposed solution is effective and feasible and makes all faults easily managed by the controller itself.
Keywords :
closed loop systems; fault diagnosis; fault tolerance; invertors; open loop systems; power convertors; power electronics; closed-loop current control; comprehensive analysis; control algorithm; dSPACE system; fault analysis; fault detection testing; fault diagnosis; fault management testing; fault reconfiguration; fault-tolerant inverter prototype; generalized switching function; nonredundant fault-tolerant VSI; open-loop current control; power converter reliability; power electronics; three-phase voltage source inverter; Circuit faults; Fault tolerance; Fault tolerant systems; Insulated gate bipolar transistors; Inverters; Mathematical model; Vectors; Control; Fault diagnosis; Fault tolerance; Inverters; Power converters; Pulse width modulation; fault diagnosis; fault tolerance; inverters; power converters; pulsewidth modulation;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2015.2402645