• DocumentCode
    627830
  • Title

    A methodology for system-level fault injection based on gate-level faulty behavior

  • Author

    Robache, R. ; Boland, J.-F. ; Thibeault, Claude ; Savaria, Yvon

  • Author_Institution
    Electr. Eng. Dept., Ecole de Technol. Super., Montréal, QC, Canada
  • fYear
    2013
  • fDate
    16-19 June 2013
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In this paper a methodology for creating a high-level faulty models library for simulating low-level fault injection is proposed. The concept of faulty behavior Signature is first proposed in this work. This paper demonstrates how faulty behavior Signatures allow building high level models, for example using Simulink, that reflect with high fidelity the faulty behavior of a combinational circuit represented at gate-level injected with one fault arbitrarily selected from a fault list. It is shown that we are able to capture this behavior with a correlation coefficient of 99.93%.
  • Keywords
    combinational circuits; fault diagnosis; logic testing; combinational circuit; gate-level faulty behavior; high-level faulty model library; low-level fault injection; system-level fault injection; Aerospace electronics; Circuit faults; Integrated circuit modeling; Logic gates; Object oriented modeling; Software packages; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    New Circuits and Systems Conference (NEWCAS), 2013 IEEE 11th International
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-0618-5
  • Type

    conf

  • DOI
    10.1109/NEWCAS.2013.6573663
  • Filename
    6573663