DocumentCode :
627865
Title :
Learning Cultured Neuronal Network Evolution Using False Discovery Rate Analysis
Author :
Napoli, Antonio ; Obeid, I.
Author_Institution :
Dept. of Electr. & Comput. Eng., Temple Univ., Philadelphia, PA, USA
fYear :
2013
fDate :
5-7 April 2013
Firstpage :
25
Lastpage :
26
Abstract :
Despite numerous studies carried out using Multi Electrode Arrays (MEAs), there are no quantitative studies that assess how the development of dissociated rat cortical neurons can be affected by chronic external stimulation. Furthermore, there is a lack of quantitative analysis tools in use for processing spike data sets recorded from large neuronal populations. With this work, we want to emphasize the importance of using statistical analysis as a mathematical tool to identify functional and significant electrical connections, to quantify the temporal evolution and the early development of dissociated cortical neurons when presented with external stimulation. The False Discovery Rate technique we propose guarantees that when analyzing the neuronal evoked responses, we are accounting for the natural variability and randomness that are typical characteristics of the nervous system. Our preliminary findings suggest that electrical stimulation has significant effects on neuron electrical activity.
Keywords :
bioelectric phenomena; biomedical electrodes; brain; medical signal processing; microelectrodes; neural nets; statistical analysis; chronic external stimulation; cultured neuronal network evolution; dissociated rat cortical neurons; false discovery rate analysis; multielectrode arrays; spike data sets; statistical analysis; Biological neural networks; Educational institutions; Electrical stimulation; Electrodes; Neurons; Statistical analysis; Testing; False Discovery Rate; MEA recordings; dissociated cortical neurons; neuronal network temporal evolution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Bioengineering Conference (NEBEC), 2013 39th Annual Northeast
Conference_Location :
Syracuse, NY
ISSN :
2160-7001
Print_ISBN :
978-1-4673-4928-4
Type :
conf
DOI :
10.1109/NEBEC.2013.22
Filename :
6574339
Link To Document :
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