DocumentCode
627865
Title
Learning Cultured Neuronal Network Evolution Using False Discovery Rate Analysis
Author
Napoli, Antonio ; Obeid, I.
Author_Institution
Dept. of Electr. & Comput. Eng., Temple Univ., Philadelphia, PA, USA
fYear
2013
fDate
5-7 April 2013
Firstpage
25
Lastpage
26
Abstract
Despite numerous studies carried out using Multi Electrode Arrays (MEAs), there are no quantitative studies that assess how the development of dissociated rat cortical neurons can be affected by chronic external stimulation. Furthermore, there is a lack of quantitative analysis tools in use for processing spike data sets recorded from large neuronal populations. With this work, we want to emphasize the importance of using statistical analysis as a mathematical tool to identify functional and significant electrical connections, to quantify the temporal evolution and the early development of dissociated cortical neurons when presented with external stimulation. The False Discovery Rate technique we propose guarantees that when analyzing the neuronal evoked responses, we are accounting for the natural variability and randomness that are typical characteristics of the nervous system. Our preliminary findings suggest that electrical stimulation has significant effects on neuron electrical activity.
Keywords
bioelectric phenomena; biomedical electrodes; brain; medical signal processing; microelectrodes; neural nets; statistical analysis; chronic external stimulation; cultured neuronal network evolution; dissociated rat cortical neurons; false discovery rate analysis; multielectrode arrays; spike data sets; statistical analysis; Biological neural networks; Educational institutions; Electrical stimulation; Electrodes; Neurons; Statistical analysis; Testing; False Discovery Rate; MEA recordings; dissociated cortical neurons; neuronal network temporal evolution;
fLanguage
English
Publisher
ieee
Conference_Titel
Bioengineering Conference (NEBEC), 2013 39th Annual Northeast
Conference_Location
Syracuse, NY
ISSN
2160-7001
Print_ISBN
978-1-4673-4928-4
Type
conf
DOI
10.1109/NEBEC.2013.22
Filename
6574339
Link To Document